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Hi-Contact is the ultimate test solution for large I/O Probe card. Its simple design, excellent mass productivity and reliable performance Enable customers to minimize test cost with better test performance.

HiCon Co., Ltd.CEO : Dan. HwangAddress : 9th floor, Star Tower, 37, Sagimakgol-ro 62beon-gil, Jungwon-gu, Seongnam-si, Gyeonggi-do, Republic of Korea, Postal code:13211

Tel : 82-31-698-2741,2740Fax : 82-31-698-2745Email : hicon@hi-con.kr

Copyright © 2017 HICON Co., Ltd. All rights reserved.